GATEST Test Vectors
The GATEST sequential circuit test generator is described in the
following paper and dissertation:
-
Sequential circuit test generation in a genetic algorithm
framework,
Elizabeth M. Rudnick,
Janak H. Patel,
Gary S. Greenstein, and Thomas M. Niermann,
Proceedings of the ACM/IEEE Design Automation Conference,
pp. 698-704, June 1994.
-
Simulation-based techniques for sequential circuit
testing,
Elizabeth M. Rudnick,
Ph.D. dissertation, Department of Electrical and Computer Engineering,
Technical Report CRHC-94-14/UILU-ENG-94-2229,
University of Illinois, August 1994.
Last Updated: September 10, 1997
Send any questions to liz@uiuc.edu