A listing of all published IGATE research papers on bridge fault
testng is included below.
Jue Wu and
Elizabeth M. Rudnick,
IEEE Transactions on Computer-Aided Design, vol. 19, no. 4,
pp. 489-495, April 2000.
Jue Wu, Gary S. Greenstein, and
Elizabeth M. Rudnick,
Proceedings of the Design, Automation and Test in Europe (DATE)
Conference,
pp. 780-781, March 1999.
Jue Wu and
Elizabeth M. Rudnick,
Proceedings of the International Conference on VLSI Design,
January 1999.
James P. Cusey and
Janak H. Patel,
Proceedings of the International Test Conference,
pp. 838-847, November 1997.
Tzuhao Chen,
Ibrahim N. Hajj,
Elizabeth M. Rudnick, and
Janak H. Patel,
Proceedings of the IEEE International Workshop on IDDQ Testing,
pp. 74-78, October 1996.
Terry Lee,
Ibrahim N. Hajj,
Elizabeth M. Rudnick, and
Janak H. Patel,
Proceedings of the VLSI Test Symposium, pp. 456-462,
April 1996.
Frederick R. Gruner,
M.S. thesis, Department of Electrical and Computer Engineering,
Technical Report CRHC-95-07/UILU-ENG-95-2205,
University of Illinois, February 1995.
Jeffrey R. Rearick and
Janak H. Patel,
Proceedings of the International Test Conference,
pp. 54-61, October 1993.
James P. Cusey,
M.S. thesis, Department of Electrical and Computer Engineering,
Technical Report CRHC-93-13/UILU-ENG-93-2223,
University of Illinois, June 1993.
part 1
part 2
Jeffrey R. Rearick,
M.S. thesis, Department of Electrical and Computer Engineering,
Technical Report CRHC-93-03/UILU-ENG-93-2204,
University of Illinois, January 1993.
Janak H. Patel and
Gary S. Greenstein,
Proceedings of the International Electron Devices and Materials
Symposium, pp. 170-174, November 1992.
Gary S. Greenstein and
Janak H. Patel,
Proceedings of the IEEE/ACM International Conference on
Computer-Aided Design, pp. 268-271, November 1992.
Abstract
Gary S. Greenstein,
M.S. thesis, Department of Electrical and Computer Engineering,
Technical Report CRHC-92-07,
University of Illinois, April 1992.
Last Updated: October 12, 2000
Send any questions to liz@uiuc.edu