ATOM Combinational ATPG
The ATOM combinational circuit ATPG system is described in the
following paper:
- New
Techniques for Deterministic Test Pattern Generation,
Ilker
Hamzaoglu and Janak
H. Patel, Proceedings of the VLSI Test Symposium, pp. 446-452,
April 1998.
Test Vectors:
- Vectors generated by ATOM using fault simulation.
- Vectors generated by ATOM without using fault simulation,
i.e. the test set for a given circuit contains one vector for each
detectable fault in that circuit.
Source
Code.
Note: The test sets generated by ATOM for all the ISCAS circuits have
100% fault coverage.
Last Updated: March 18, 2005
Send any questions to liyang@crhc.uiuc.edu
Back to IGATE