% Steve Lumetta's postdoctoral publication list
%
% X-Codes section
%
% BibTeX bibliography file

@InProceedings{iCompact,
    author =	{J.~H.~Patel and S.~S.~Lumetta and S.~M.~Reddy},
    title =	{{Application of Saluja-Karpovsky Compactors to Test
                  Responses with Many Unknowns}},
    booktitle =	{Proceedings of the 21st IEEE VLSI Test Symposium},
    month =	{April},
    year =	{2003},
    address =	{Napa Valley, California},
    pages =     {107-112},
    URL =	{http://www.crhc.uiuc.edu/~steve/papers/i-compact.pdf},
    link =	{PDF version}
}

@InProceedings{isit03,
    author =	{S.~S.~Lumetta and S.~Mitra},
    title =	{{X-Codes: Error Control with Unknowable Inputs}},
    booktitle =	{Proceedings of the International Symposium on
		 Information Theory},
    month =	{June},
    year =	{2003},
    address =	{Yokohama, Japan},
    pages =     {102},
    URL =	{http://www.crhc.uiuc.edu/~steve/papers/isit03.pdf},
    link =	{PDF version},
}

@TechReport{xcode-tr,
    author =	{S.~S.~Lumetta and S.~Mitra},
    title =	{{X-Codes: Theory and Applications of Unknowable Inputs}},
    institution = {UIUC Center for Reliable and High-Performance Computing},
    number = {CRHC-03-08 (also UILU-ENG-03-2217)},
    month = {August}, 
    year = {2003},
    URL =	{http://www.crhc.uiuc.edu/~steve/papers/x-code-tr.pdf},
    link =	{PDF version},
}

@InProceedings{stochastic-xcode,
    author =	{S.~Mitra and S.~S.~Lumetta and M.~Mitzenmacher},
    title =	{{X-Tolerant Signature Analysis}},
    booktitle =	{Proceedings of the International Test Conference 2004},
    month =	{October},
    year =	{2004},
    address =	{Charlotte, North Carolina},
    pages =     {432-441},
    URL =	{http://www.crhc.uiuc.edu/~steve/papers/itc04.pdf},
    link =	{PDF version}
}

@Article{stochastic-xcode-mag,
    author =	{S.~Mitra and S.~S.~Lumetta and M.~Mitzenmacher and N.~Patil},
    title =	{{X-Tolerant Test Response Compaction}},
    journal =   {IEEE Design and Test of Computers},
    month =	{November/December},
    year =	{2005},
    volume =    {22},
    number =    {6},
    pages =     {566-574}
}

@TechReport{diag-tr,
    author =	{S.~S.~Lumetta and S.~Mitra},
    title =	{{Using Multiple Compacted Responses to Diagnose Scan Response Errors During Testing}},
    institution = {UIUC Center for Reliable and High-Performance Computing},
    number = {CRHC-06-10 (also UILU-ENG-06-2214)},
    month = {July}, 
    year = {2006},
    URL =	{http://www.crhc.uiuc.edu/~steve/papers/diag-tr.pdf},
    link =	{PDF version},
}

@InProceedings{stochastic-diag,
    author =	{N.~P.~Patil and S.~Mitra and S.~S.~Lumetta},
    title =	{{Signature Analysis Design for Yield Learning Support}},
    booktitle =	{Proceedings of the International Test Conference 2006},
    month =	{October},
    year =	{2006},
    address =	{Santa Clara, California}
}